失效分析实验室AEC-Q技术团队，执行过大量的AEC-Q测试案例，积累了丰富的知识分享试验经验，可为您提供更、更可靠的AEC-Q知识分享试验服务。
产品范围：
集成电路(IC)
测试周期：3-4个月，提供全面的知识分享计划、测试等服务
测试项目：序号测试项目缩写样品数/批批数测试方法A组加速环境应力试验A1PreconditioningPC773J-STD-020、JESD22-A113A2Temperature-Humidity-BiasTHB773JESD22-A101BiasedHASTHASTJESD22-A110A3AutoclaveAC773JESD22-A102UnbiasedHASTUHSTJESD22-A118Temperature-Humidity (withoutBias)THJESD22-A101A4Temperature CyclingTC773JESD22-A104、Appendix3A5Power Temperature CyclingPTC451JESD22-A105A6High TemperatureStorage LifeHSTL451JESD22-A103B组 加速寿命模拟试验B1High TemperatureOperating LifeHTOL773JESD22-A108B2Early Life FailureRateELFR8003AEC- Endurance, Data Retention, andOperational LifeEDR773AEC-组 封装完整性测试C1Wire BondShearWBS少5个器件中的30根键合线AEC-、AEC- BondPullWBPMIL-STD883 method2011、AEC-tySD151JESD22-B102或 J-STD-002DC4PhysicalDimensionsPD103JESD22-B100、 JESD22-B108AEC- BallShearSBS至少10个器件的5个键合球3AEC-、AEC-tyLI至少5个器件的10根引线1JESD22-B105D组 晶圆制造可靠性测试D1ElectromigrationEM///D2TimeDependent Dielectric BreakdownTDDB///D3Hot CarrierInjectionHCI///D4Negative Bias TemperatureInstabilityNBTI///D5Stress MigrationSM///E组 电学验证测试E1Pre- andPost-StressFunction/ParameterTEST所有要求做电学测试的应力试验的全部样品供应商或用户规格E2ElectrostaticDischarge Human Body ModelHBM参考测试规范1AEC-staticDischarge Charged DeviceModelCDM参考测试规范1AEC-pLU61AEC-calDistributionsED303AEC gFG--AEC-erizationCHAR--AEC-eticCompatibilityEMC11SAE J1752/3-辐射E10Short CircuitCharacterizationSC103AEC- ErrorRateSER31JEDEC无加速：JESD89-1加速：JESD89-2或JESD89-3E12Lead (Pb)FreeLF参考测试规范参考测试规范AEC-Q005F组 缺陷筛选测试F1Process AverageTestingPAT//AEC- Bin/Yield AnalysisSBA//AEC-Q002G组密封封装完整性测试G1Mechanical ShockMS151JESD22-B104G2Variable FreV151JESD22-B103G3Constant AccelerationCA151MIL-STD883Method 2001G4Gross/Fine LeakGFL151MIL-STD883 Method 1014G5PackageDropDROP51/G6Lid Tor Method 2024G7DieShearDS51MIL-STD883 Method 2019G8Internal WaterVaporIWV51MIL-STD883 Method 1018